Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x~800000x

A63.7081

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Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x~800000x

15x~800000x Schottky Field Emission Gun Scanning Electron Microscope
E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage
Non Conduction Sample Can Be Observed Directly No Need To Be Sputtered In Low Voltage
Easy & Friendly Operation Interface, All Controled By Mouse In Windows System
Large Sample Room With Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.320mm

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Product Description

A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM
Resolution		1nm@30KV(SE); 3nm@1KV(SE); 2.5nm@30KV(BSE)
Magnification		15x~800000x
Electron Gun		Schottky Emission Electron Gun
Electron Beam Current		10pA~0.3μA
Accelerating Voatage		0~30KV
Vacuum System		2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump
Detector		SE: High Vacuum Secondary Electron Detector (With Detector Protection)
		BSE: Semiconductor Four Segmentation Back Scattering Detector
		CCD
Specimen Stage		Five Axes Eucentric Motorized Stage
Travel Range	X	0~150mm
	Y	0~150mm
	Z	0~60mm
	R	360º
	T	-5º~75º
Max Specimen Diameter		320mm
Modification		EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser Etc.
Accessories		X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine Etc.

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Advantage and Cases

Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.

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Company Information

Pictures Hide Same Show Difference
Model No.	A63.7081	A63.7062	A63.7080	A63.7069
Applications	Laboratory	Laboratory	——	——
Standard Magnification	15x~800000x	5x-250000x	15x~500000x	6x-600000x
Head Specification	1nm@30KV(SE) 3nm@1KV(SE) 2.5nm@30KV(BSE)	4.5nm@1KV(SE) 6nm@30KV(BSE)	1.5nm@15KV(SE) 3nm@20KV(BSE)	3nm@1KV(SE) 6nm@30KV(BSE)
Objective	Detector SE, BSE, CCD	Detector SE,	Detector SE, BSE, CCD	Detector SE, BSE,CCD
Working Stage Spec.	Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.320mm	Five Axes Stage (Auto X/Y, Manual Z/R/T), Max Speicmen Dia.150mm	Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.175mm	Five Axes Stage (Auto X/Y, Manual Z/R/T), Max Speicmen Dia.175mm
Light Source Feature	Transmit Light	Transmit Light	Transmit Light	Transmit Light
Transmit Light	Schottky Field Emission Gun, Beam Current 10pA~0.3μA, Voltage 0~30KV	Tungsten Filament Catridge, Voltage 0~30KV	Schottky Field Emission Gun, Beam Current 10pA~0.3μA, Voltage 0~30KV	Tungsten Filament Catridge, Voltage 0~30KV
Other Specification	2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump.	Turbo Molecular Pump, Mechanical Pump.	2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump.	Turbo Molecular Pump, Mechanical Pump.

A63.7081

Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x~800000x

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