A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM
1nm@30KV(SE); 3nm@1KV(SE); 2.5nm@30KV(BSE)
Schottky Emission Electron Gun
Electron Beam Current
2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump
SE: High Vacuum Secondary Electron Detector (With Detector Protection)
BSE: Semiconductor Four Segmentation Back Scattering Detector
Five Axes Eucentric Motorized Stage
Max Specimen Diameter
EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser Etc.
X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine Etc.
Advantage and Cases
Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.