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Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x
Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x

A63.7069-LV

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Tungsten Filament Scanning Electron Microscope, Low Vacuum, SED+BSDE+CCD, 8x~300000x


  • 8x~300000x With Detector SED+BSED+CCD, Five Axes Stage (Auto X/Y, Manual Z/R/T)
  • Upgradeable LaB6, X-Ray Detector, EBSD, CL, WDS, Coating Machine And Etc.
  • Multi Modification EBL, STM, AFTM, Heatign Stage, Cryo Stage, Tensile Stage, SEM+Laser And Etc.
  • Auto Calibration, Auto Faulty Detection, Low Cost For Maintain & Repair
  • Easy & Friendly Operation Interface, All Controled By Mouse In Computer Windows System (Included)
Quantity:

 
 
 
 
 
 
 
 
 
A63.7069 Software Main Function
High pressure regulationVertical line scan Potential shift regulation
Filament current regulationCondenser adjustment Multi scale measurement
Astigmatic adjustmentElectric to central adjustmentAutomatic brightness / contrast
Brightness adjustmentObjective lens adjustmentAuto focus
Contrast adjustmentPhoto PreviewAutomatic astigmatism elimination
Magnification adjustmentActive rulerAutomatic filament adjustment
Selected area scanning mode4 Scanning speed settingManagement of parameters
Point scanning modeObjective lens inversion Image snapshot, image freezing
Surface scanningCondenser reversalOne Key Quick View 
Horizontal line scanningElectric rotation adjustment 

SEMA63.7069 & A63.7069-LVA63.7080 & A63.7080-L & A63.7080-MA63.7081
Resolution3nm@30KV(SE)
6nm@30KV(BSE)
1.5nm@30KV(SE)
3nm@30KV(BSE)
1.0nm@30KV(SE)
3.0nm@1KV(SE)
2.5nm@30KV(BSE)
Magnification8x~300000x Negative True Magnification8x~800000x Negative True Magnification6x~1000000x Negative True Magnification
Electron GunPre-Centered Tungsten Filament CartridgeSchottky Field Emission GunSchottky Field Emission Gun
VoltageAccelerating Voltage 0~30KV, Continuous Adjustable, Adjust Step 100V@0-10Kv, 1KV@10-30KV 
Quick ViewOne Key Quick View Image FunctionN/AN/A
Lens SystemThree-levels Electromagnetic Tapered LensMulti-levels Electromagnetic Tapered Lens
Aperture3 Molybdenum Objective Apertures, Adjustable Outside Of Vacuum System, No Need Disassemble Objective To Change Aperture 
Vacuum System1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>2.6E-3Pa
Electron Gun Room Vacuum>2.6E-3Pa
Fully Auto Vacuum Control
Vacuum Interlock Function

Optional Model: A63.7069-LV
1 Turbo Molecular Pump
2 Mechanical Pumps
Sample Room Vacuum>2.6E-3Pa
Electron Gun Room Vacuum>2.6E-3Pa
Fully Auto Vacuum Control
Vacuum Interlock Function

Low Vacuum Range 10~270Pa For Quick Switch in 90 Seconds For BSE(LV) 
1 Ion Pump Set
1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>6E-4Pa
Electron Gun Room Vacuum>2E-7 Pa
Fully Auto Vacuum Control
Vacuum Interlock Function
1 Sputter Ion Pump
1 Getter Ion Compound Pump
1 Turbo Molecular Pump
1 Mechanical Pump
Sample Room Vacuum>6E-4Pa
Electron Gun Room Vacuum>2E-7 Pa
Fully Auto Vacuum Control
Vacuum Interlock Function
DetectorSE: High Vacuum Secondary Electron Detector (With Detector Protection)SE: High Vacuum Secondary Electron Detector (With Detector Protection)SE: High Vacuum Secondary Electron Detector (With Detector Protection)
BSE: Semiconductor 4 Segmentation
Back Scattering Detecto
OptionalOptional
Optional Model: A63.7069-LV
BSE(LV): Semiconductor 4 Segmentation
Back Scattering Detector
CCD:Infrared CCD CameraCCD:Infrared CCD CameraCCD:Infrared CCD Camera
Extend Port2 Extend Ports On Sample Room For
EDS, BSD, WDS etc.
4 Extend Ports On Sample Room For
BSE, EDS, BSD, WDS etc.
4 Extend Ports On Sample Room For
BSE, EDS, BSD, WDS etc.
Specimen Stage5 Axes Stage, 4 Auto+1ManualControl
Travel Range:
X=70mm, Y=50mm, Z=45mm,
R=360°, T=-5°~+90°(Manual)
Touch Alert & Stop Function
5 Axes AutoMiddleStage
Travel Range:
X=80mm, Y=50mm, Z=30mm,
R=360°, T=-5°~+70°
Touch Alert & Stop Function

Optional Model:

A63.7080-M 5 Axes ManualStage
A63.7080-L 5 Axes AutoLargeStage
5 Axes AutoLargeStage
Travel Range:
X=150mm, Y=150mm, Z=60mm,
R=360°, T=-5°~+70°
Touch Alert & Stop Function
Max SpecimenDia.175mm, Height 35mmDia.175mm, Height 20mmDia.340mm, Height 50mm
Image SystemReal Still Image Max Resolution 4096x4096 Pixels,
Image File Format: BMP(Default), GIF, JPG, PNG, TIF
Real Still Image Max Resolution 16384x16384 Pixels,
Image File Format: TIF(Default), BMP, GIF, JPG, PNG
Video: Auto Record Digital .AVI Video
Real Still Image Max Resolution 16384x16384 Pixels,
Image File Format: TIF(Default), BMP, GIF, JPG, PNG
Video: Auto Record Digital .AVI Video
Computer & SoftwarePC Work Station Win 10 System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Computer Specification No Less Than Inter I5 3.2GHz, 4G Memory, 24"IPS LCD Monitor, 500G Hard Disk, Mouse, Keyboard
Photo DisplayThe Image Level Is Rich And Meticulous, Showing Real Time Magnification, Ruler, Voltage, Gray Curve
Dimension
& Weight
Microscope Body 800x800x1850mm
Working Table 1340x850x740mm
Total Weight 400Kg
Microscope Body 800x800x1480mm
Working Table 1340x850x740mm
Total Weight 450Kg
Microscope Body 1000x1000x1730mm
Working Table 1330x850x740mm
Total Weight 550Kg
Optional Accessories
Optional AccessoriesA50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7001BSE Back Scattering Electron Detector
A50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7030 Motorize Control Panel
A50.7001BSE Back Scattering Electron Detector
A50.7002 EDS Energy Dispersive X-Ray Spectrometer
A50.7011 Ion Sputtering Coater
A50.7030 Motorize Control Panel
A50.7001BSE DetectorSemiconductor Four Segment Back Scattering Detector;
Available In Ingredients A+B, Morphology Info A-B;
Available Sample Observe Without Sputtering Gold;
Available In Observe Impurity And Distribution From Grayscale Map Directly.
A50.7002EDS (X Ray Detector)Silicon Nitride (Si3N4) Window To Optimize Low Energy X-ray Transmission For Light Element Analysis;
Excellent Resolution And Their Advanced Low-noise Electronics Provide Outstanding Throughput Performance;
The Small Footprint Offers Flexibility To Ensure Ideal Geometry And Aata Collection Conditions;
The Detectors Contain A 30mm2 Chip.
A50.7003EBSD (Electron Beam Backscattered Diffraction)user could analysis crystal orientation, crystal phase and micro texture of materials and related materials performance,etc.
automatic optimization of EBSD camera settings
during the data collection, do interactive real-time analysis  to obtain maximum information
all the data were branded with time tag, which can be viewed at any time
high resolution 1392 x 1040 x 12
Scanning and index speed: 198 points / sec, with Ni as the standard, under the condition of 2~5nA, it can ensure the index rate ≥99%;
works well under the condition of low beam current and low voltage of 5kV at 100pA
orientation measuring accuracy: Better than 0.1 degrees
Using triplex index system: no need rely on single band definition , easy indexing of poor pattern quality
dedicated database: EBSD special database obtained by electron diffraction: >400 phase structure
Index ability: it can automatically index all crystal materials of 7 crystal systems.
The advanced options include calculating elastic stiffness (Elastic Stiffness), Taylor (Taylor) factor, Schmidt (Schmid) factor and so on.
A50.7010Coating MachineGlass Protecting Shell: ∮250mm; 340mm High;
Glass Processing Chamber:
∮88mm; 140mm High, ∮88mm; 57mm High;
Specimen Stage Size: ∮40mm (max);
Vacuum System:molecula Pump And Mechanical Pump;
Vacuum Detection: Pirani Gage;
Vacuum:better Than 2 X 10-3 Pa;
Vacuum Protection:20 Pa With Microscale Inflation Valve;
Specimen Movement: Plane Rotation,tilt Precession.
A50.7011Ion Sputtering CoaterGlass Processing Chamber: ∮100mm; 130mm High;
Specimen Stage Size: ∮40mm( Hold 6 Specimen Cups) ;
Golden Target Size: ∮58mm*0.12mm(thickness);
Vacuum Detection: Pirani Gage;
Vacuum Protection:20 Pa With Microscale Inflation Valve;
Medium Gas:argon Or Air With Argon Gas Special Air Inlet And Gas Regulating In Microscale.
A50.7012Argon Ion Sputtering CoaterThe Sample Was Plated With Carbon And Gold Under High Vacuum;
Rotatable Sample Table, Uniform Coating, Particle Size About 3-5nm;
No Selection Of Target Material, No Damage To Samples;
The Functions Of Ion Cleaning And Ion Thinning Can Be Realized.
A50.7013Critical Point DryerInner Diameter: 82mm, Inner Length: 82mm;
Pressure Range:0-2000psi;
Temperature Range:0°-50° C (32°-122° F)
A50.7014Electron Beam LithographyBased On Scanning Electron Microscope, A Novel Nano-exposure System Was Developed;      
The Modificaton Has Kept All The Sem Functions For Making Nanoscale Line Width Image;
The Modificated Ebl System Widly Applied Into Microelectronic Devices, Optoelectronic Devices, Quantun Devices, Microelectronics System R&d.
A63.7069 Standard Consumables Outfit
1Tungsten FilamentPre-centered, Imported1 Box (5 pcs)
2Sample CupDia.13mm5 Pcs
3Sample CupDia.32mm5 Pcs
4Carbon Double-sided Conductive Tape6mm1 Package
5Vacuum Grease 10 Pcs
6Hairless Cloth 1 Tube
7Polishing Paste 1 Pc
8Sample Box 2 Bags
9Cotton Swab 1 Pc
10Oil Mist Filter 1 Pc
A63.7069 Standard Tools & Parts Outfit
1Inner Hexagon Spanner1.5mm~10mm1 Set
2TweezersLength 100-120mm1 Pc
3Slotted Screwdriver2*50mm, 2*125mm2 Pcs
4Cross Screwdriver2*125mmm1 Pc
5Diaphragm Remover 1 Pc
6Cleaning Rod 1 Pc
7Filament Adjustment Tool 1 Pc
8Filament Adjusting Gasket 3 Pc
9Tube Extractor 1 Pc
Pictures
Model No. A63.7069-LV
Standard Magnification
6x-600000x
Head Specification
3nm@1KV(SE)
6nm@30KV(BSE)
Objective
Detector SE, BSE,CCD
Working Stage Spec.
Five Axes Stage (Auto X/Y, Manual Z/R/T), Max Speicmen Dia.175mm
Transmit Light
Tungsten Filament Catridge, Voltage 0~30KV
Other Specification
Turbo Molecular Pump, Mechanical Pump.

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